An Engineer's Guide to Automated Testing of High-Speed Interfaces

An Engineer's Guide to Automated Testing of High-Speed Interfaces

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Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses at advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.One of the major challenges of the HDMI/TMDS interface is its AVcc voltage level of 3.3 V. This level might pose a challenge for testing HDMI ... [8] H. Werkmann, a€œ PCI Express: ATE Requirements and DFT Features for Functional Test Optimization, a€ IEEE European Test Workshop, May 2003. ... [11] B. Holden, J. Trodden, and D. Anderson, HyperTransport 3.1 Interconnect Technology. ... 2009 . 0033_changes.pdf.

Title:An Engineer's Guide to Automated Testing of High-Speed Interfaces
Author: Jose Moreira, Hubert Werkmann
Publisher:Artech House - 2010

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